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    KEYCOM Products

    Permittivity and Dielectric loss tangent Measurement Systems (εr', tanδ/Dk, Df) Model No. DPS

    Ellipsometry Method, Dielectric Constant and Permeability Measurement System(Dk/Df)

    Model No. DPS02


    Because this system is designed for a scalar measurement, it does not require an expensive vector network analyzer.
    It measures the changes of the amplitude values in the polarization reflected by the sample, followed by a calculation of complex relative permittivety and complex permeability.
    Unlike coaxial or waveguide type, errors by air gap do not occur because the sample is not capsulated in the fixture.
    Despite its compact dimensions, your sample can be measured with plane wave because the lenses are attached to the antennas, providing high measurement accuracy.
    Samples can be smaller than conventional systems because they can be placed in the vicinity of the antennas.
    You can measure εr' and μr at frequencies you need.

    Specifications


    • The higher the measurement frequency is, the smaller the size of your sample can be.

    Model No.

    Configurations